1

In-situ trace analysis of materials with SIMS

Year:
1983
Language:
english
File:
PDF, 2.23 MB
english, 1983
22

Application of pattern recognition methods in secondary ion mass spectrometry

Year:
1986
Language:
english
File:
PDF, 484 KB
english, 1986
23

Quantitative analysis of silicon-oxynitride films by EPMA

Year:
1999
Language:
english
File:
PDF, 771 KB
english, 1999
24

Optimisation of plasma techniques for trace analysis of refractory metals

Year:
1995
Language:
english
File:
PDF, 622 KB
english, 1995
28

The characterization of high-tech materials: Perspectives, challenges, trends

Year:
1991
Language:
english
File:
PDF, 4.80 MB
english, 1991
46

Ultratrace and microdistribution analysis in material sciences

Year:
1990
Language:
english
File:
PDF, 3.17 MB
english, 1990